I like my FIB technology updates to be OCCASIONAL, SHORT, INFORMED, HELPFUL, NOT TOO SERIOUS and FREE

I like my FIB technology updates to be OCCASIONAL, SHORT, INFORMED, HELPFUL, NOT TOO SERIOUS and FREE

Dear LinkedIN and NanoScope contacts – New and Old Firstly – thanks for being connected – If you are, then we share a mutual interest in a technical area where I, and my company NanoScope Services, are active. It could be FIB Circuit nano-surgery, Microscopes and accessories, FIB applications development, Failure Analysis, or even Marketing. But it could even be low cost qualification of automotive parts for space applications – so a diverse Nano-bag of outsourced R&D support, but all linked to advanced FIB Nano-engineering. I think LinkedIN is a great format for sharing updates – but I am terrible at this, and I need to improve. So… after several years of complete silence (hey, we’ve been busy…), it’s time again to reach out and renew those contacts and friendships from so many projects and collaborations. Over the next couple of months I’m going to post some LinkedIN articles about new techniques and capabilities – and how they can add value, and maybe how we can too. (check out some previews here, here, here and here if you are the impatient type) I can promise these feeds will have all the attributes I myself value in a message – they will be OCCASIONAL, SHORT, INFORMED, HELPFUL, NOT TOO SERIOUS and FREE (with a cool picture). Please comment if the urge takes you – good or bad, it’s all good, especially if it’s about something we don’t do yet, or something we can do better. Let’s start a conversation this Summer. With kind regards,...
NanoScope to present at the 4th Admati Technical Seminar at the Tel Aviv Hilton on 28th April 2015.

NanoScope to present at the 4th Admati Technical Seminar at the Tel Aviv Hilton on 28th April 2015.

    Press release 10th March 2015 Every two years Admati Agency hosts an ‘invite only’ technical seminar for their growing customer base and some new invitees in Israel. The seminar provides a forum for introducing the latest developments from the firms represented by Admati and also to introduce the capabilities of the latest companies to join the group since the last meeting. NanoScope partnered with Admati in 2014 and this year we will present our Semiconductor and high tech support services at this seminar for the first time. This year the seminar will be held on the 28-April-2015 at the Tel Aviv Hilton. We will be presenting our capabilities for advanced FIB (Focused Ion Beam) IC circuit nano-surgery, single node Failure Analysis with comprehensive de-capsulation capabilities, rapid Fab process qualifications and advanced microscopy for small geometries and materials analysis. Other companies presenting will be: Intel – Case study presentation Reltech – Independent Reliability testing services Phasix ESD – Independent ESD testing services Special guest speaker (to be announced) ThermoFisher Scientific, Interconnect Devices (IDI) and others to be confirmed. A more detailed agenda will be released nearer the date to registrants. Representatives from 17 major Israeli semiconductor companies are registered to attend and we expect several more over the coming weeks. If you are interested to learn more about the meeting please contact us here. Request a LinkedIN invite here.      Go to the NanoScope website here. Telephone +44 (0)1179576225       Send an email here. Contact : Lloyd Peto NanoScope Services Ltd. No30 Station Road Workshops Kingswood Bristol BS15 4PJ,...
Agar Press Release 25th June 2014

Agar Press Release 25th June 2014

Press Release 25th June 2014 – Bristol, UK Agar Scientific and NanoScope Services sign collaborative agreement to offer advanced TEM sectioning services. NanoScope Services Ltd., a focused ion beam (FIB) and microscopy laboratory based in Bristol, UK, and Agar Scientific, a wholly owned subsidiary of Elektron Technology UK Ltd. and renowned supplier of microscopy products based in Stansted, UK, have teamed up to offer a unique section preparation service for transmission electron microscopy (TEM) to materials scientists across Europe and beyond. This new FIB technique offers several key technical advantages over conventional mechanical and broad beam section preparation techniques, particularly for complex or difficult materials systems. FIB sections permit a relatively large viewing area in the TEM and may be prepared from very specific features with a minimal amount of mechanical preparation required prior to starting the process. “This new service has been specifically tailored to the needs of industrial and academic materials scientists, giving them easy access to turn-key sectioning services that can save them significant time,” said Lloyd Peto, Commercial Director at NanoScope Services. “Agar Scientific is the perfect partner for us in this market.” Darren Likely, Business Unit Director at Elektron Technology Uk Ltd., added “Agar has a terrifically wide selection of products and accessories to support our sophisticated customer base, and we are pleased to now be able to add outsourced services to this list. The TEM section preparation service from NanoScope has the technical and commercial quality that our customers have come to expect from Agar.” The new TEM section preparation service will be offered through the Agar on-line catalogue and is part of...
FIB is cool – but what about blogging?

FIB is cool – but what about blogging?

Apparently the only two things that you should never try are folk music and incest, so blogging must surely be in the other column. Well here goes…. I’m a first generation pure FIB technologist – in that my first microscope was a Focussed Ion Beam instrument and I only learned how to use an SEM and other techniques later on. The immediacy and interactive nano-surgery capabilities of the technology, captured my interest on day one, and I’m as hooked now as I was then. Since 1992 I have been lucky enough to work for Rutherford Appleton, FEI Company (twice)- now Thermo, Micrion Corporation (now FEI), Raith GmbH and now NanoScope Services. I’ve helped develop many of the main aspects of how this technology is employed – from writing the first published FEI TEM sample prep protocol, and developing new sample holders for the 611 and FIB 800, through 3D gun-shot residue and forensic analysis and AFM tip customisation, and leading the applications initiative for using Cryo-DualBeam within the Life-Sciences. The latest major project was developing and rolling out an entirely new FIB technique for truly automated 3D nano-fabrication using ultra fine Ga+ beams now called IBL or Ion Beam Lithography for Raith GmbH (see ionLiNE ). I have become co-author on over 100 publications for this application alone. ( I don’t have time to write papers myself). FIB is cool, and everyday we get to do cool new stuff for scientists and engineers from across the Nanotech spectrum. From Circuit Edit to Solid State Nanopores and frozen Fibroblast sectioning, from VCSELs and OLED’s to GSR and FZP’s, FIB is enabling...