Failure Analysts and Product Test Engineers
Electrical Micro-Probing – also to FIB deposited pads connected to buried nodes
Probing permits the driving or monitoring of a voltage or signal at any mid-circuit node(s) with or without available probe pads.
Our micro-probing facility with optical microscope permits direct electrical connection to structures down to 10×10 microns. This is sufficient to connect to power structures and any nodes connected to FIB deposited probe pads in a device.
We have a number of different probe types available or customers can repeat their own tips setup and test condition. Power supplies and a Tektronix curve tracer are on-site and available for your use to support your test protocol and confirm your FIB-layout edits and functionality changes are successful.
For a detailed description of the equipment and techniques available, go to the Tools and Techniques page.
There are 3 clear advantages
- It can be QUICK as it can be done directly on opened circuits without changing the device layout.
- IT WORKS ON PASSIVATED TOP LAYER TRACKS – by using FIB to open windows in the passivation coating.
- IT WORKS ON BURIED NODES –by first depositing a FIB probe pad on top of the passivation and connecting it down to the target node.
Don't be shy, get in touch.
If you are not sure about an aspect of this technique we’re happy to chat through it with you.
NanoScope has been successful in acquiring much of the FA capability of the Unisem facility and we are now in the process of transferring this equipment over to our Bristol Laboratory.read more
Here I discuss why the growth in MEMS development is lagging the growth that was witnessed for IC development in many respects – but highlighting that there are valuable lessons available to accelerate future growth too.read more
Our invited presentation titled ‘When Integration Goes Wrong – your Nano-Surgery Options’ was given at the recent NMI meeting at Imagination Technologies in Kings Langsleyread more