FIBxTEM Section Lift Out Solutions from NanoScope

A high quality, low cost ex-situ solution for every FIB and FIB-SEM lab.

This ‘ex-situ’ lift-out solution from NanoScope, combines an optical microscope with extra long working distance lenses and precision hydraulic nano-manipulation, for the routine extraction of FIBxTEM sections from bulk samples to TEM grids.

This high quality British constructed and guaranteed optical microscope has been configured by NanoScope engineers to provide the best solution for this FIB application.  Click HERE to receive your PDF brochure.

The distinctive features of the lift-out system are:

  • Extra long working distance objectives
  • Integrated dual illumination system
  • Extreme depth travel mechanical stage
  • Bespoke objective turret configuration
  • High precision hydraulic nano-manipulator
  • Nanoprobe puller
  • Camera and webcam options
  • High yield protocols
  • Most comprehensive configuration available
  • Most economical solution available

‘ex-situ’ TEM section lift-out has many advantages over ‘in-situ’ section lift out.

  • It works on a much wider variety of materials
  • It has a high success rate
  • It is much faster
  • It requires no beam time (benchtop not in-situ)
  • It is more cost effective
  • The optical microscope can be used for other applications.

Best value solution

The ex-situ lift-out system is available for 1/3rd of the price of some other solutions and offers the best configuration for FIBxTEM lift-out.

Our ECO-configuration

Our Full-configuration

Your configuration – contact us for the options list

The illumination system is bespoke and has an integrated 6v, 30 watt quartz halogen incident illumination system with rheostat brightness control and iris diaphragm with lateral movement adjusters. The incident illumination can be either plain or polarised. Also integrated is a rheostat controlled, dual goose neck LED cold lighting system that can illuminate the specimen from any angle (independently from the standard pathway). The two lighting systems can be used seperately or together at any illumination ratio, and are particularly useful for non metal opaque specimens that are not particularly reflective. This combination enables the user to quickly locate FIB milled trenches on samples with complex surface morphology and reflective characteristics.

The microscope is based on an industrial standard metallurgical trinocular microscope with a particularly large specimen stage. Finished in beige enamel with a superior build quality.

The trinocular head allows full illumination to the binocular eyetubes or to the trinocular tube for digital photography. Full interocular and dioptric adjustment with x10 wide field eyepieces.

The stage has been customised to enable the use of the long working distance lenses and to permit the highest possible angle of access for the nano-manipulator and incident light for optimised lift-out.

The objective lenses are the latest evolution of high quality lens technology and provide the industries longest working distances. Lenses may be supplied as infinity corrected, bright field or NIR compatible with magnifications of 5X, 10X, 20X, 50X and 100X. For our ‘Eco Configuration’ we offer these three lenses:

M Plan Apo HL x5 (n.a. 0.14). Infinity corrected. Working distance = 45.0 mm’s.

M Plan Apo L x10 (n.a. 0.28). Infinity corrected. Working distance = 34.0 mm’s.

M Plan Apo SL x50 (n.a. 0.42). Infinity corrected. Working distance = 20.5 mm’s.

The Nano-manipulator is an industry standard unit used for high precision work and may be adjusted for sensitivity by the user. It combines a coarse 3 axis manual positioning system with a mechanically decoupled, precision 3 axis oil-hydraulic, joystick controlled positioning system. This configuration has been supplied for this application by NanoScope engineers since its launch.

The Nano-probe puller produces glass probes with a specific physical profile providing the mechanical behaviour necessary for optimised TEM section extraction.

Camera options include a high spec. Canon digital camera with movie options and dedicted PC software for image capture and manipulation (₤600). There is also a lower resolution streaming CCD camera option with PC software which can function as a webcam (₤300).

Sizes – the ex-situ system is also available with 200mm and 300mm microscope body and stage configurations.
Please contact NanoScope for more information at

Quality – NanoScope engineers have been involved with the configuration, supply and daily commercial use of benchtop section lift-out systems since their introduction in 1998. The microscope supplied as part of the ex-situ liftout package contains all the latest enhancements for high success lift-out and for a fraction of the normal market price. We have accepted no compromise on any aspect of the quality of the instrument and it is constructed, supported and guaranteed by our UK optical microscopy partner.

High yield protocols – NanoScope has refined the technique of benchtop section lift-out and we offer additional dedicated training courses, on-site installation visits and also some free ‘tricks and tips’ to customers for helping to avoid the most common early learning pitfalls.

All you need – the ex-situ system comes with all the necessary consumables needed to get started, including Agar TEM grids, glass pipettes for probe making, grid transport boxes for lifted sections,  security shipping bags and section location maps.

NanoScope to present at the 4th Admati Technical Seminar at the Tel Aviv Hilton on 28th April 2015.

    Press release 10th March 2015 Every two years Admati Agency hosts an ‘invite only’ technical seminar for their growing customer base and some new invitees in Israel. The seminar provides a forum for introducing the latest developments from the firms represented by Admati and also to introduce the capabilities of the latest companies to join the group since the last meeting. NanoScope partnered with Admati in 2014 and this year we will present our Semiconductor and high tech support services at this seminar for the first time. This year the seminar will be held on the 28-April-2015 at the Tel Aviv Hilton. We will be presenting our capabilities for advanced FIB (Focused Ion Beam) IC circuit nano-surgery, single node Failure Analysis with comprehensive de-capsulation capabilities, rapid Fab process qualifications and advanced microscopy for small geometries and materials analysis. Other companies presenting will be: Intel – Case study presentation Reltech – Independent Reliability testing services Phasix ESD – Independent ESD testing services Special guest speaker (to be announced) ThermoFisher Scientific, Interconnect Devices (IDI) and others to be confirmed. A more detailed agenda will be released nearer the date to registrants. Representatives from 17 major Israeli semiconductor companies are registered to attend and we expect several more over the coming weeks. If you are interested to learn more about the meeting please contact us here. Request a LinkedIN invite here.      Go to the NanoScope website here. Telephone +44 (0)1179576225       Send an email here. Contact : Lloyd Peto NanoScope Services Ltd. No30 Station Road Workshops Kingswood Bristol BS15 4PJ,...

New ‘best in class’ ex-situ FIBxTEM lift-out system launched

The perfect addition to any FIB or FIB-SEM laboratory, a high performance optical microscope with ultra long working distance lenses and an ‘ex-situ‘ FIBxTEM section lift-out manipulator. Go to the full product description here. Our engineers (in previous roles) configured and supplied the first version of the ex-situ lift out system to all international FIB and FIB-SEM markets for over 10 years. Now we have created a new ‘best in class’ configuration to maximise the benefits of the ex-situ approach across the widest range of materials systems. If you are not sure of the advantages of ex-situ vs in-situ, read our technical article describing all the pro’s and con’s of both techniques here. The new system configuration has been developed with the experience gained from making FIBxTEM sections from over 300 different materials systems over the last 20 years. From catalytic converters to teeth, Indium Antimonide to car paint and carbon fibre composites and nuclear fuel rod liners to aerogel, we’ve used this technique to make successful FIBxTEM sections from all these materials systems, so we know what works and more importantly, what doesn’t. Changes to the stage design, combination lighting sources and lenses, ensure that the system delivers the highest success rate possible.  In addition we have taken advantage of new manufacturing capabilities and techniques, so the system is far more economical than any other ex-situ lift-out solution which has been offered until now. Our fully capable  ‘ECO’ configuration is available for £19,650 (€24,955) with immediate delivery. To see the full product description and specifications go to the lift-out page here.  Or to get a PDF brochure click...

In-situ or Ex-situ? Get an unbiased view on which TEM section lift-out method is best for you.

NanoScope FIB technology article. Just posted here is the full article discussing the relative merits of both methods of FIBxTEM section extraction and the factors to consider when choosing which is better for your sample types. You may think the answer is a foregone conclusion, with in-situ foil extraction being clearly more advanced and more effective as an extraction method than ex-situ, but hold on to that thought, as there may be some less obvious issues that are worth your consideration. Included here is a detailed analysis of each of these rival techniques across the following areas of applicability – 1st      Speed – with the hands down winner being ex-situ 2nd     Yield – more controversial with advocates on both sides 3rd     Quality issues (of the section produced) 4th     Cost – a clear winner here 5th     Versatility – not such a common topic but vital for TEM users 6th     Ease of use – this must be a slam dunk or? 7th     Special circumstances Lets just check our terms and the common perception of what’s what for this technique. FIBxTEM section or foil = The site specific FIB milled sample biopsy that is FIB polished to become electron transparent and extracted to a TEM grid before being transferred to a TEM microscope for more detailed studies. ‘in-situ’ foil extraction – where a ‘thick’ biopsied section is transferred to a TEM grid inside the FIB-SEM instrument using a nano-manipulator and attached there before being FIB polished to the required ‘thinness’ and then transferred to a TEM. ‘ex-situ’ foil extraction – where a site specific feature is thinned to electron transparency BEFORE extraction, then...
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Ex-situ liftout brochure PDF