LiveOPTICAL® and LiveFIB®

LiveOPTICAL® service launched, to compliment our LiveFIB® imaging over a secure video feed.

LiveOPTICAL® video conferencing

LiveOPTICAL® remote project conferencing is the latest innovation from NanoScope. By extending our UNIQUE LiveFIB® capability to include OPTICAL MICROSCOPY and NANOMANIPULATION, NanoScope clients can now supervise all aspects of their projects, from the comfort of their own office.

By bringing together these complimentary microscopy techniques with real time project supervision, you can have the confidence to send your most valuable projects for actioning, while focusing on other important tasks. These powerful visual aids and on-line collaboration also have removed the need for you to travel to supervise these specialist interventions. On-line collaboration also significantly reduces the documentation work required for each job and your travel costs.

Device Modification or Materials Analysis has never been greener or more cost effective.

Several conferencing software options support NanoScopes Live Microscopy options. Just click here to ask.

A magnified optical microscope image of a semiconductor device seen via a SKYPE user interface over the web.

An annotated FIB image of a semiconductor device during a via milling process seen via web link in a SKYPE user interface.

LiveFIB® – secure video conferencing during FIB interventions on your samples

NanoScopes UNIQUE LiveFIB® capability effectively puts a Focused Ion Beam microscope into the office of every engineer who needs one.

All Ion Beam applications can be done remotely and with real time consultation to accelerate the process and minimise the costs.

World class results without any instrument or expert engineer costs are available on an ‘as needed’ basis and without and training or lengthy preparation.

Log onto LiveFIB® and watch your problems get ionised.

NanoScope to present at the 4th Admati Technical Seminar at the Tel Aviv Hilton on 28th April 2015.

    Press release 10th March 2015 Every two years Admati Agency hosts an ‘invite only’ technical seminar for their growing customer base and some new invitees in Israel. The seminar provides a forum for introducing the latest developments from the firms represented by Admati and also to introduce the capabilities of the latest companies to join the group since the last meeting. NanoScope partnered with Admati in 2014 and this year we will present our Semiconductor and high tech support services at this seminar for the first time. This year the seminar will be held on the 28-April-2015 at the Tel Aviv Hilton. We will be presenting our capabilities for advanced FIB (Focused Ion Beam) IC circuit nano-surgery, single node Failure Analysis with comprehensive de-capsulation capabilities, rapid Fab process qualifications and advanced microscopy for small geometries and materials analysis. Other companies presenting will be: Intel – Case study presentation Reltech – Independent Reliability testing services Phasix ESD – Independent ESD testing services Special guest speaker (to be announced) ThermoFisher Scientific, Interconnect Devices (IDI) and others to be confirmed. A more detailed agenda will be released nearer the date to registrants. Representatives from 17 major Israeli semiconductor companies are registered to attend and we expect several more over the coming weeks. If you are interested to learn more about the meeting please contact us here. Request a LinkedIN invite here.      Go to the NanoScope website here. Telephone +44 (0)1179576225       Send an email here. Contact : Lloyd Peto NanoScope Services Ltd. No30 Station Road Workshops Kingswood Bristol BS15 4PJ,...

New ‘best in class’ ex-situ FIBxTEM lift-out system launched

The perfect addition to any FIB or FIB-SEM laboratory, a high performance optical microscope with ultra long working distance lenses and an ‘ex-situ‘ FIBxTEM section lift-out manipulator. Go to the full product description here. Our engineers (in previous roles) configured and supplied the first version of the ex-situ lift out system to all international FIB and FIB-SEM markets for over 10 years. Now we have created a new ‘best in class’ configuration to maximise the benefits of the ex-situ approach across the widest range of materials systems. If you are not sure of the advantages of ex-situ vs in-situ, read our technical article describing all the pro’s and con’s of both techniques here. The new system configuration has been developed with the experience gained from making FIBxTEM sections from over 300 different materials systems over the last 20 years. From catalytic converters to teeth, Indium Antimonide to car paint and carbon fibre composites and nuclear fuel rod liners to aerogel, we’ve used this technique to make successful FIBxTEM sections from all these materials systems, so we know what works and more importantly, what doesn’t. Changes to the stage design, combination lighting sources and lenses, ensure that the system delivers the highest success rate possible.  In addition we have taken advantage of new manufacturing capabilities and techniques, so the system is far more economical than any other ex-situ lift-out solution which has been offered until now. Our fully capable  ‘ECO’ configuration is available for £19,650 (€24,955) with immediate delivery. To see the full product description and specifications go to the lift-out page here.  Or to get a PDF brochure click...

In-situ or Ex-situ? Get an unbiased view on which TEM section lift-out method is best for you.

NanoScope FIB technology article. Just posted here is the full article discussing the relative merits of both methods of FIBxTEM section extraction and the factors to consider when choosing which is better for your sample types. You may think the answer is a foregone conclusion, with in-situ foil extraction being clearly more advanced and more effective as an extraction method than ex-situ, but hold on to that thought, as there may be some less obvious issues that are worth your consideration. Included here is a detailed analysis of each of these rival techniques across the following areas of applicability – 1st      Speed – with the hands down winner being ex-situ 2nd     Yield – more controversial with advocates on both sides 3rd     Quality issues (of the section produced) 4th     Cost – a clear winner here 5th     Versatility – not such a common topic but vital for TEM users 6th     Ease of use – this must be a slam dunk or? 7th     Special circumstances Lets just check our terms and the common perception of what’s what for this technique. FIBxTEM section or foil = The site specific FIB milled sample biopsy that is FIB polished to become electron transparent and extracted to a TEM grid before being transferred to a TEM microscope for more detailed studies. ‘in-situ’ foil extraction – where a ‘thick’ biopsied section is transferred to a TEM grid inside the FIB-SEM instrument using a nano-manipulator and attached there before being FIB polished to the required ‘thinness’ and then transferred to a TEM. ‘ex-situ’ foil extraction – where a site specific feature is thinned to electron transparency BEFORE extraction, then...
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