Nano Zone

Nano fabrication and prototyping applications and customising nanotools using FIB.

Direct Ion Beam Nano-fabrication

Ion Beams lend themselves immediately to nano-machining applications. The ability to directly inspect or prepare high resolution TEM sections for analysing nano-structures is already a well know capability of FIB and FIB-SEM instruments.

Beyond this the ability to deposit electrical connections to any tiny structure from piezo probes to carbon nano-tubes, or trim nano-structures to optimise their novel behaviours can be achieved in very short time lines. From nano-imprint masters for holography to nano-pore machining for DNA molecule filtering, FIB as a nano-fabrication technique is an essential tool for the nano-researcher.

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The Clifton Suspension Bridge machined by FIB into a Gold bondwire just 13 microns in diameter – 1/6th as thick as a human hair.

 

Enabling toolsets for advanced MEMS development

Probes and tips for AFM, SPM, micro-indenters, electrical probing, SNOM and nano-manipulation may be customised using FIB in just a few minutes. Form and function and even the chemical coating of many probe variants may be customised to compliment your process. Serving the European market since 1994, the engineers at NanoScope offer extensive experience both with existing MEMS applications, and rapid new process development.

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A multi-walled carbon nano-tube with an Ion Beam deposited 4 point probe measurement electrode added.

Multiple FIB modified nano-tip images including an atom probe, a nano-indenter, a SNOM tip and a Piezoelectric tip with ion beam deposited electrical connections added.

NanoScope engineers have been applying FIB to nano-structures to enable and accelerate nano-research for over a decade, and we’re happy to provide a candid assessment of the applicability of FIB to assist your project, and to help you deliver results in a shorter time frame.

 

Call us for ‘off the shelf’ Nano-Surgery, when you need it.

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University of Bath Nano-Imprint master machined into a Gold substrate.

“Having developed a good working relationship with NanoScope services. IQE have always found the service friendly, reliable, responsive and professional. The NanoScope team are always willing to work through any special customer requirements. IQE have found it extremely useful being able to call on this wealth of specialist knowledge.”

IQE Europe Ltd

New ‘best in class’ ex-situ FIBxTEM lift-out system launched

The perfect addition to any FIB or FIB-SEM laboratory, a high performance optical microscope with ultra long working distance lenses and an ‘ex-situ‘ FIBxTEM section lift-out manipulator. Go to the full product description here. Our engineers (in previous roles) configured and supplied the first version of the ex-situ lift out system to all international FIB and FIB-SEM markets for over 10 years. Now we have created a new ‘best in class’ configuration to maximise the benefits of the ex-situ approach across the widest range of materials systems. If you are not sure of the advantages of ex-situ vs in-situ, read our technical article describing all the pro’s and con’s of both techniques here. The new system configuration has been developed with the experience gained from making FIBxTEM sections from over 300 different materials systems over the last 20 years. From catalytic converters to teeth, Indium Antimonide to car paint and carbon fibre composites and nuclear fuel rod liners to aerogel, we’ve used this technique to make successful FIBxTEM sections from all these materials systems, so we know what works and more importantly, what doesn’t. Changes to the stage design, combination lighting sources and lenses, ensure that the system delivers the highest success rate possible.  In addition we have taken advantage of new manufacturing capabilities and techniques, so the system is far more economical than any other ex-situ lift-out solution which has been offered until now. Our fully capable  ‘ECO’ configuration is available for £19,650 (€24,955) with immediate delivery. To see the full product description and specifications go to the lift-out page here.  Or to get a PDF brochure click...

Agar Press Release 25th June 2014

Press Release 25th June 2014 – Bristol, UK Agar Scientific and NanoScope Services sign collaborative agreement to offer advanced TEM sectioning services. NanoScope Services Ltd., a focused ion beam (FIB) and microscopy laboratory based in Bristol, UK, and Agar Scientific, a wholly owned subsidiary of Elektron Technology UK Ltd. and renowned supplier of microscopy products based in Stansted, UK, have teamed up to offer a unique section preparation service for transmission electron microscopy (TEM) to materials scientists across Europe and beyond. This new FIB technique offers several key technical advantages over conventional mechanical and broad beam section preparation techniques, particularly for complex or difficult materials systems. FIB sections permit a relatively large viewing area in the TEM and may be prepared from very specific features with a minimal amount of mechanical preparation required prior to starting the process. “This new service has been specifically tailored to the needs of industrial and academic materials scientists, giving them easy access to turn-key sectioning services that can save them significant time,” said Lloyd Peto, Commercial Director at NanoScope Services. “Agar Scientific is the perfect partner for us in this market.” Darren Likely, Business Unit Director at Elektron Technology Uk Ltd., added “Agar has a terrifically wide selection of products and accessories to support our sophisticated customer base, and we are pleased to now be able to add outsourced services to this list. The TEM section preparation service from NanoScope has the technical and commercial quality that our customers have come to expect from Agar.” The new TEM section preparation service will be offered through the Agar on-line catalogue and is part of...

In-situ or Ex-situ? Get an unbiased view on which TEM section lift-out method is best for you.

NanoScope FIB technology article. Just posted here is the full article discussing the relative merits of both methods of FIBxTEM section extraction and the factors to consider when choosing which is better for your sample types. You may think the answer is a foregone conclusion, with in-situ foil extraction being clearly more advanced and more effective as an extraction method than ex-situ, but hold on to that thought, as there may be some less obvious issues that are worth your consideration. Included here is a detailed analysis of each of these rival techniques across the following areas of applicability – 1st      Speed – with the hands down winner being ex-situ 2nd     Yield – more controversial with advocates on both sides 3rd     Quality issues (of the section produced) 4th     Cost – a clear winner here 5th     Versatility – not such a common topic but vital for TEM users 6th     Ease of use – this must be a slam dunk or? 7th     Special circumstances Lets just check our terms and the common perception of what’s what for this technique. FIBxTEM section or foil = The site specific FIB milled sample biopsy that is FIB polished to become electron transparent and extracted to a TEM grid before being transferred to a TEM microscope for more detailed studies. ‘in-situ’ foil extraction – where a ‘thick’ biopsied section is transferred to a TEM grid inside the FIB-SEM instrument using a nano-manipulator and attached there before being FIB polished to the required ‘thinness’ and then transferred to a TEM. ‘ex-situ’ foil extraction – where a site specific feature is thinned to electron transparency BEFORE extraction, then...
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