LiveOPTICAL® and LiveFIB®
LiveOPTICAL® service launched, to compliment our secure LiveFIB® remote access FIB imaging.
LiveOPTICAL® video conferencing
LiveOPTICAL® remote project conferencing is the latest innovation from NanoScope. By extending our UNIQUE LiveFIB® capability to include OPTICAL MICROSCOPY and NANOMANIPULATION, NanoScope clients can now supervise all aspects of their projects, from the comfort of their own office.
By bringing together these complimentary microscopy techniques with real time project supervision, you can have the confidence to send your most valuable projects for actioning, while focusing on other important tasks. These powerful visual aids and on-line collaboration also have removed the need for you to travel to supervise these specialist interventions. Remote access FIB imaging and online collaboration also significantly reduces the documentation work required for each job and your travel costs.
Device Modification or Materials Analysis has never been greener or more cost effective.
Several conferencing software options support NanoScopes Live Microscopy options. Just click here to ask.
A magnified optical microscope image of a semiconductor device seen via a SKYPE user interface over the web.
An annotated FIB image of a semiconductor device during a via milling process seen via web link in a SKYPE user interface.
LiveFIB® – secure video conferencing during FIB interventions on your samples
NanoScopes UNIQUE LiveFIB® capability effectively puts a Focused Ion Beam microscope into the office of every engineer who needs one.
We offer secure remote access FIB imaging across all Ion Beam applications alongside real time consultation to accelerate the process and minimise the costs.
World class results without any instrument or expert engineer costs are available on an ‘as needed’ basis and without and training or lengthy preparation.
Log onto LiveFIB® and watch your problems get ionised.
Merry Christmas 2022 – Festive Nano-machining, Imaging and Analysis for fun.
Merry Christmas 2022 to all our friends and partners.
European / Middle East Issue: Winter 2022
European / Middle East Issue: Winter 2022 A new IC design FIB Nano-surgery datapoint, our JEDEC MSL Rel-test services and Euros discount. Dear NanoScope Customer, greetings in our first email since COVID. For Silicon DESIGNERS we’ve got a new node success data point, for RELIABILITY Engineers there are new MSL testing services, for EU customers there is our 1€ = 1£ deal, plus NanoScope is growing. First FIB circuit nano-surgery fix to a 7nm node, from the FRONTSIDE. Our unique expertise has allowed us to successfully modify this advanced 7nm process with 13 metal layers at the M2 level, from the front. The device die was then flipchip packaged and tested with a 65% yield. The benefit for the customer concerned was ‘invaluable’. Watch out for the upcoming article on this story. Don’t forget to read our 1st article on ‘How to get the most benefit from IC Nano-Surgery” – part 2 coming soon. Launching our low cost MSL testing service for packaged parts for both R&D and production Reliability. All MSL testing is done to JEDEC standards, but now for the first time customers can choose to have a JEDEC CERTIFIED or an UNCERTIFIED test. R&D lots don’t require certification, so why not save 30% on your MSL trials of new packages? Loading a test lot for Temperature Humidity Bias testing (THB) New colleague – supporting accounts, logistics, orders, quality and billing We’re pleased to introduce Janine Stone, who is now managing project administration and compliance at NanoScope, adding much needed bandwidth for our technical offerings. Contact Janine here. Please welcome Janine Stone to the NanoScope team. We’re re-introducing our 1€ = 1£ exchange rate. To help our EU customers during this period of economic chaos, our 1:1 exchange rate adds clarity, security and a 16%...
How to get the most benefit from FIB IC Nano-surgery?
There are many advantages of correcting an IC design with FIB Nano-Surgery, but sometimes there are also problems, and many designers have been put off the technique. Did your last FIB work as you expected? Or was the yield low? or you got results you couldn’t explain? A quick recap of the reasons to do a FIB edit and how you would go about it, might be helpful. SCENE: So you’ve taped out your big new design, and 4 months and ₤400,000 /$/€ later, your 1st Silicon devices have arrived for tests to start. And immediately, there’s a problem. If you are lucky, then a normal functional test has failed and after a few days of head scratching it becomes clear what the cause is, and what the most likely metal fix should be. If you are unlucky and it’s more subtle, but still a show stopper for customer acceptance, then the fix strategy may be less obvious. Either way, prompt action is required and there are some difficult decisions to make. Your colleagues, customers and suppliers are all waiting to help get your product to market. Then there is the expense and the delays: to testing, to qualification, to sales and to revenue – which all add up to a serious commercial inconvenience. What ARE your options here? Risk a design change because there is a high confidence that the fix is understood? Do you roll the dice (the expensive and time consuming ones) and trust that the fix will work? Or spend a week trying to get a few chips fixed using FIB nano-surgery and give yourself some...Don't Be Shy. Get In Touch.
If you are interested in working together, send us an inquiry and we will get back to you straight away.