Nano Zone

Nanofabrication services, prototyping applications and customising nanotools using FIB.

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University of Bath Nano-Imprint master machined into a Gold substrate.

Direct Ion Beam Nanofabrication services

Ion Beams lend themselves immediately to nano-machining applications. The ability to directly inspect or prepare high resolution TEM sections for analysing nano-structures is already a well know capability of FIB and FIB-SEM instruments.

Beyond this the ability to deposit electrical connections to any tiny structure from piezo probes to carbon nano-tubes, or trim nano-structures to optimise their novel behaviours can be achieved in very short time lines. From nano-imprint masters for holography to nano-pore machining for DNA molecule filtering, our FIB nanofabrication service is an essential tool for the nano-researcher.

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The Clifton Suspension Bridge machined by FIB into a Gold bondwire just 13 microns in diameter – 1/6th as thick as a human hair.

 

Enabling toolsets for advanced MEMS development

Probes and tips for AFM, SPM, micro-indenters, electrical probing, SNOM and nano-manipulation may be customised using FIB in just a few minutes. FIB can quickly customise the profile of AFM tips from a wide variety of materials – from Silicon to Diamond, with novel forms such as hammer heads or super-sharp tips which can be used to support specific project requirements.

Form and function and even the chemical coating of many probe variants may be customised to compliment your process. Serving the European market since 1994, the engineers at NanoScope offer extensive experience both with existing MEMS applications, and rapid new process development using our nanofabrication services.

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A multi-walled carbon nano-tube with an Ion Beam deposited 4 point probe measurement electrode added.

Or if you want to image the surface instead of modify it

For AFM service information

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nanofabrication services created custom tool tip

FIB machined Diamond super-tip – 20nm radius

Multiple FIB modified nano-tip images including an atom probe, a nano-indenter, a SNOM tip and a Piezoelectric tip with ion beam deposited electrical connections added.

NanoScope engineers have been applying FIB to nano-structures to enable and accelerate nano-research for over a decade, and we’re happy to provide a candid assessment of the applicability of FIB and our nanofabrication services to assist your project and to help you deliver results in a shorter time frame.

Call us for ‘off the shelf’ Nano-Surgery, when you need it.

“Having developed a good working relationship with NanoScope services. IQE have always found the service friendly, reliable, responsive and professional. The NanoScope team are always willing to work through any special customer requirements. IQE have found it extremely useful being able to call on this wealth of specialist knowledge.”

IQE Europe Ltd

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Merry Christmas 2023 – It’s been a Quality Year adding these exciting new Capabilities

Closure times – NanoScope is closed from 20th December 2023 to the 5th January 2024 Our big company NEWS is that we are now ISO 9001:2015 Certified In our bid to improve our services on all fronts, we are very proud to have achieved ISO 9001 certification at the end of 2023 – more details to follow. We have already implemented our Quality Management System so you may spot these changes when you use us next. Our NEW microscope this year is a Sonoscan D24 Acoustic Microscope (large area CSAM). this state-of-the-art CSAM is already providing pre- and post- JEDEC Reliability checks for stress testing batches of devices (inc MSL testing) its providing checks for voids in complex planar sandwiches of materials – like polymers and metals it is also used as a Failure Analysis diagnostic tool for on-board packaging as a compliment to our X-ray capability. Our New Technique this year is our Plasma FIB Capability. We can offer ThermoFisher Hydra capabilities to our customers now including Xe for rapid milling of large sections – up to 100’s of μm in size/depth Ar for low kV polishing of (S)TEM sections and FEG SEM for high resolution imaging and Analysis in-situ. Lastly our new Sample Preparation Technique is Mechanical Grinding and Polishing. As boards and modules get smaller and more complex, the boundary between substrate and die requires more advanced investigation, so the need for accurate mechanical sectioning as a starting point for any structural analysis becomes increasingly important. Good Mechanical prep is more often the starting point for a Plasma or Gallium FIB section. (Section of a Section...

How to get the most benefit from FIB IC Nano-surgery?

There are many advantages of correcting an IC design with FIB Nano-Surgery, but sometimes there are also problems, and many designers have been put off the technique. Did your last FIB work as you expected? Or was the yield low? or you got results you couldn’t explain? A quick recap of the reasons to do a FIB edit and how you would go about it, might be helpful. SCENE: So you’ve taped out your big new design, and 4 months and ₤400,000 /$/€ later, your 1st Silicon devices have arrived for tests to start. And immediately, there’s a problem. If you are lucky, then a normal functional test has failed and after a few days of head scratching it becomes clear what the cause is, and what the most likely metal fix should be. If you are unlucky and it’s more subtle, but still a show stopper for customer acceptance, then the fix strategy may be less obvious. Either way, prompt action is required and there are some difficult decisions to make. Your colleagues, customers and suppliers are all waiting to help get your product to market. Then there is the expense and the delays: to testing, to qualification, to sales and to revenue – which all add up to a serious commercial inconvenience. What ARE your options here? Risk a design change because there is a high confidence that the fix is understood? Do you roll the dice (the expensive and time consuming ones) and trust that the fix will work? Or spend a week trying to get a few chips fixed using FIB nano-surgery and give yourself some...
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