'QwikQual'

Chip makers, QwikQual gets your process ramped up or helps correct a yield excursion.

Chip Makers and FAB Product Engineers.

‘QwikQual’ can help get your process ramped up, or speed up the solving of a yield excursion in your process.

Sometimes you need to know what your process tool is achieving at a specific location which is critical to your final yield, and so we have introduced a rapid instrument qualification process for FAB engineers, who need site specific process data on a sameday/next day basis.

Our ‘QwikQual’ service is for 1 or 2 micro cross-sections with imaging and calibrated metrology taken from a specific location to help you independently qualify your manufacturing equipment – specifically for clients who have pre-registered for this service.

We will email the images directly to you as they are produced, allowing you to make quick decisions for your production line and your process.

This service is ideal for foundries who are ‘ramping up’ a new process or for supplying site specific customer qualification data or for non-standard Quals.

Its got to be


  • FAST
  • Independent
  • 
From the right location
  • 
Correct (Accurate)
  • Referenced to traceable standards
  • Reasonably priced

 

How do I do that?


 

  • BEFORE – Sign up to ‘QwikQual’ service
  • TODAY – Ship the sample to us to arrive just after 8am – not before (or before 5pm for next day work) – do this first – 2 sections max
  • Call us for taxi or bike courier contacts
  • TODAY – Email us your sectioning job instructions (guidelines on website) and telephone us to advise that there is a project arriving.
  • TOMORROW – We run the job before ‘start of day’
  • TOMORROW – results emailed to you before 10AM
  • 
PO – draw down to agreed limit
  • You can watch on the web with ‘LiveFIB’ if you want.

How do I get the most benefit from FIB IC Nano-surgery? (a.k.a. Circuit Edit, a Metal Fix, a FIB, Cut and Paste) Nov 2020

There are many advantages of correcting an IC design with FIB Nano-Surgery, but sometimes there are also problems, and many designers have been put off the technique. Did your last FIB work as you expected? Or was the yield low? or you got results you couldn’t explain? A quick recap of the reasons to do a FIB edit and how you would go about it, might be helpful. SCENE: So you’ve taped out your big new design, and 4 months and ₤400,000 /$/€ later, your 1st Silicon devices have arrived for tests to start. And immediately, there’s a problem. If you are lucky, then a normal functional test has failed and after a few days of head scratching it becomes clear what the cause is, and what the most likely metal fix should be. If you are unlucky and it’s more subtle, but still a show stopper for customer acceptance, then the fix strategy may be less obvious. Either way, prompt action is required and there are some difficult decisions to make. Your colleagues, customers and suppliers are all waiting to help get your product to market. Then there is the expense and the delays: to testing, to qualification, to sales and to revenue – which all add up to a serious commercial inconvenience. What ARE your options here? Risk a design change because there is a high confidence that the fix is understood? Do you roll the dice (the expensive and time consuming ones) and trust that the fix will work? Or spend a week trying to get a few chips fixed using FIB nano-surgery and give yourself some...
Page 1 of 812345...Last »

Don't Be Shy. Get In Touch.

If you are interested in working together, send us an inquiry and we will get back to you straight away.

Contact Us