FIB TEM Ex-Situ Lift Out Solution from NanoScope

A high quality, low cost ex-situ solution for every FIB and FIB-SEM lab.

Our ‘ex-situ’ lift-out solution

This FIB TEM ex-situ lift out solution combines an optical microscope with extra long working distance lenses and precision hydraulic nano-manipulation, for the routine extraction of FIBxTEM sections from bulk samples to TEM grids.

This high quality British constructed and guaranteed optical microscope has been configured by NanoScope engineers to provide the best solution for this FIB application.  Click HERE to receive your PDF brochure.

FIB TEM ex-situ lift out solution EXLO

The distinctive features of the FIB TEM ex-situ lift out solution are:

  • Extra long working distance objectives
  • Integrated dual illumination system
  • Extreme depth travel mechanical stage
  • Bespoke objective turret configuration
  • High precision hydraulic nano-manipulator
  • Nanoprobe puller
  • Camera and webcam options
  • High yield protocols
  • Most comprehensive configuration available
  • Most economical solution available

‘Ex-situ’ TEM section lift-out has many advantages over ‘in-situ’ section lift out.

  • It works on a much wider variety of materials
  • It has a high success rate
  • It is much faster
  • It requires no beam time (benchtop not in-situ)
  • It is more cost effective
  • The optical microscope can be used for other applications.

Best value solution

The FIB TEM ex-situ lift out solution (EXLO) is available for 1/3rd of the price of some other systems and offers the best configuration for FIBxTEM lift-out.

Our ECO-configuration

Our Full-configuration

Your configuration – contact us for the options list

The illumination system is bespoke and has an integrated 6v, 30 watt quartz halogen incident illumination system with rheostat brightness control and iris diaphragm with lateral movement adjusters. The incident illumination can be either plain or polarised. Also integrated is a rheostat controlled, dual goose neck LED cold lighting system that can illuminate the specimen from any angle (independently from the standard pathway). The two lighting systems can be used seperately or together at any illumination ratio, and are particularly useful for non metal opaque specimens that are not particularly reflective. This combination enables the user to quickly locate FIB milled trenches on samples with complex surface morphology and reflective characteristics.

The microscope is based on an industrial standard metallurgical trinocular microscope with a particularly large specimen stage. Finished in beige enamel with a superior build quality.

The trinocular head allows full illumination to the binocular eyetubes or to the trinocular tube for digital photography. Full interocular and dioptric adjustment with x10 wide field eyepieces.

The stage has been customised to enable the use of the long working distance lenses and to permit the highest possible angle of access for the nano-manipulator and incident light for optimised lift-out.

Not right?

If you prefer to do our lift-out inside your FIB

Go to in-situ liftout solution

The objective lenses are the latest evolution of high quality lens technology and provide the industries longest working distances. Lenses may be supplied as infinity corrected, bright field or NIR compatible with magnifications of 5X, 10X, 20X, 50X and 100X. For our ‘Eco Configuration’ we offer these three lenses:

M Plan Apo HL x5 (n.a. 0.14). Infinity corrected. Working distance = 45.0 mm’s.

M Plan Apo L x10 (n.a. 0.28). Infinity corrected. Working distance = 34.0 mm’s.

M Plan Apo SL x50 (n.a. 0.42). Infinity corrected. Working distance = 20.5 mm’s.

The Nano-manipulator is an industry standard unit used for high precision work and may be adjusted for sensitivity by the user. It combines a coarse 3 axis manual positioning system with a mechanically decoupled, precision 3 axis oil-hydraulic, joystick controlled positioning system. This configuration has been supplied for this application by NanoScope engineers since its launch.

The Nano-probe puller produces glass probes with a specific physical profile providing the mechanical behaviour necessary for optimised TEM section extraction.

Camera options include a high spec. Canon digital camera with movie options and dedicted PC software for image capture and manipulation (₤600). There is also a lower resolution streaming CCD camera option with PC software which can function as a webcam (₤300).

Sizes – the FIB TEM ex-situ lift out solution is also available with 200mm and 300mm microscope body and stage configurations.
Please contact NanoScope for more information at

Quality – NanoScope engineers have been involved with the configuration, supply and daily commercial use of benchtop section lift-out systems since their introduction in 1998. The microscope supplied as part of the ex-situ liftout package contains all the latest enhancements for high success lift-out and for a fraction of the normal market price. We have accepted no compromise on any aspect of the quality of the instrument and it is constructed, supported and guaranteed by our UK optical microscopy partner.

High yield protocols – NanoScope has refined the technique of benchtop section lift-out and we offer additional dedicated training courses, on-site installation visits and also some free ‘tricks and tips’ to customers for helping to avoid the most common early learning pitfalls.

All you need – the FIB TEM lift out solution comes with all the necessary consumables needed to get started, including Agar TEM grids, glass pipettes for probe making, grid transport boxes for lifted sections,  security shipping bags and section location maps.

FIB TEM ex-situ lift out solution - lenses

Contact us to receive the full product brochure as a PDF

Click below

Ex-situ liftout brochure PDF

Now 1€ = 1₤ till Brexit is settled

Dear EU contacts and customers, As the UK general ‘Brexit’ Election gets underway – we invite all our EU customers to VOTE AS WELL. NanoScope have voted to boost the Euro exchange rate again. So now until Brexit is settled your 1€ spent will buy your ₤1 of support for your Semiconductor Design FIB-Nanosurgery, Nano-tech development or Failure Analysis project. With a record low Euro to GBP exchange rate – there is already a smart advantage to placing your project with us in the UK, and with this offer you can vote for an extra 19% cost reduction (exchange rate buy Euros 29/11/2019). Click here to get a quote NanoScope Services – your European FIB IC Nano-surgery Lab  ...

E-Newsletter Summer 2019

Here are some examples of our new services, and how they complement our existing imaging and non-destructive analysis. There is a quick guide to the specific advantages of each technique to show how your FA, NPI or development project can benefit.

New ‘best in class’ ex-situ FIBxTEM lift-out system launched

The perfect addition to any FIB or FIB-SEM laboratory, a high performance optical microscope with ultra long working distance lenses and an ‘ex-situ’ FIBxTEM section lift-out manipulator. Our new ‘best in class’ configuration maximises the benefits of the ex-situ approach across the widest range of materials systems.

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