I hope to see you there- DM me now to book a 1 to 1 chat. Lets talk about… – FIB IC Nano-surgery for Chip designers to test and de-risk layout changes. – Failure Analysis for Silicon, III/V’s, PCB’s and Modules, from boards to gates. – Environmental/Reliability testing – with CSAM and FA support. – FAB process qualifications – with nextday referenced metrology data. 📆 24 – 25 Sept | Excel London 🎯 www.microelectronicsuk.com 📍 Booth: H60 hashtag#MicroelectronicsUK hashtag#DeepTech hashtag#SemiconductorDesign Go to LinkedIn...
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