Circuit Nano-Surgery and Failure Analysis Online Tutorial

Circuit Nano-Surgery and Failure Analysis Online Tutorial

NanoScope gave an Online invited Tutorial on behalf of IMAPS UK on the 18th September 2020 on the subject of Focused Ion Beam (FIB) Circuit Nano-Surgery and Failure Analysis from Board to Gate. The Tutorial Archives can be accessed here. This presentation included a comparison of Cross Sectioning techniques with a comparison of the benefits and limitations of each method. Conventional Mechanical sectioning (with extended capabilities) vs FIB micro-sectioning vs Plasma FIB Sectioning. Also included was an introduction to the techniques of Silicon IC Circuit Nano-Surgery and other IC specific techniques that are now becoming possible to perform on package substrates, system boards, complex packages and other novel die mounting...
We are OPEN.

We are OPEN.

Let’s carefully collaborate our way through the ongoing Covid 19 crisis, and help drive the post pandemic recovery and growth. Luckily we were already set up for working with you remotely, so we can seamlessly support your new designs/products or analysis so that you can to be ready, and your projects still on time. To adapt to the new reality of Covid19, there has had to be a few subtle changes to the way we operate – but it’s all very sensible.  We have adapted our protocols to operate normally while protecting our own staff (even from each other)  Our Couriers are still running so sending and receiving devices/boards/samples is still normal.  Our free project consultancy is unchanged via telephone and via video conferencing.  We have upgraded the bandwidth and refresh times of our LiveFIB and LiveOPTICAL remote consultancy/microscopy options – you can still visit to supervise your work being done – but now ‘virtually’. This also saves non-urgent travel risks and costs.  Sample handling is always done in sterile conditions, and return shipping is in sterile packaging. For you this means  No new risks for you for handling, shipping, discussing and supervising external projects.  No new project delays, lower costs (no travel), less time needed for documentation (virtual meetings), same rapid project turnaround, same professional – confidential – expert service.  Extremely low exchange rates – so if you pay in Dollars or Euro’s, you have a historically lower cost. So even if you are now working from home, and things could be better – Better call NanoScope Lloyd.Peto@NanoScopeServices.com                                 +44(0)7768...
E-Newsletter Summer 2019

E-Newsletter Summer 2019

Our latest newsletter covers: New Services complement our Inspection and Analysis Options New AFM capability for rapid turn high resolution surface analysis High-resolution thermal imaging of chips and ICs – a great complement to our existing nano-surgery services X-Ray imaging for detailed inspection of a device’s internal structure and connections Acoustic Microscopy (CSAM) for detailed before/after checks. Download it here – E-Newsletter Summer...
New ‘best in class’ ex-situ FIBxTEM lift-out system launched

New ‘best in class’ ex-situ FIBxTEM lift-out system launched

The perfect addition to any FIB or FIB-SEM laboratory, a high performance optical microscope with ultra long working distance lenses and an ‘ex-situ‘ FIBxTEM section lift-out manipulator. Go to the full product description here. Our engineers (in previous roles) configured and supplied the first version of the ex-situ lift out system to all international FIB and FIB-SEM markets for over 10 years. Now we have created a new ‘best in class’ configuration to maximise the benefits of the ex-situ approach across the widest range of materials systems. If you are not sure of the advantages of ex-situ vs in-situ, read our technical article describing all the pro’s and con’s of both techniques here. The new system configuration has been developed with the experience gained from making FIBxTEM sections from over 300 different materials systems over the last 20 years. From catalytic converters to teeth, Indium Antimonide to car paint and carbon fibre composites and nuclear fuel rod liners to aerogel, we’ve used this technique to make successful FIBxTEM sections from all these materials systems, so we know what works and more importantly, what doesn’t. Changes to the stage design, combination lighting sources and lenses, ensure that the system delivers the highest success rate possible.  In addition we have taken advantage of new manufacturing capabilities and techniques, so the system is far more economical than any other ex-situ lift-out solution which has been offered until now. Our fully capable  ‘ECO’ configuration is available for £19,650 (€24,955) with immediate delivery. To see the full product description and specifications go to the lift-out page here.  Or to get a PDF brochure click...
E-Newsletter – Summer 2014

E-Newsletter – Summer 2014

Our latest newsletter contains: Our new website Information about our FA and QA services and techniques NanoScope Services wins LEP funding for new FIB Accessories product development Meet us at the upcoming NMI event in Livingstone. Download it here – E-Newsletter Summer...
E-Newsletter Spring 2014

E-Newsletter Spring 2014

Our latest newsletter covers: Plastic Package Decapsulation Gel-coat removal on MEMS devices FIB modification through WL-CSP layers Follow us on LinkedIN Download it here – E-Newsletter – Spring...
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